发明名称 Pretreatment of photoresist masking layers resulting in higher temperature device processing
摘要 Method for the production of an LSI circuit device, in which method an organic compound film such as photoresist films is suitably treated to become a heat resistant film and it is used in various production processes as a mask pattern at a temperature of more than 200 DEG C. without deforming the original size of the mask pattern.
申请公布号 US4253888(A) 申请公布日期 1981.03.03
申请号 US19790047241 申请日期 1979.06.11
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KIKUCHI, KAZUYA
分类号 H01L21/3105;H01L21/3115;(IPC1-7):H01L21/26;B05D3/06 主分类号 H01L21/3105
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