发明名称 USE OF NITRIC OXIDE TO CLEAN A SEMICONDUCTOR
摘要 <p>USE OF NITRIC OXIDE TO CLEAN A SEMICONDUCTOR A procedure for cleaning a semiconductor material of impurities which reside on the surface of the material is disclosed. The procedure is indicated for use prior to one or more thermal processing steps for the material, and involves the exposure of the material to a cleaning gas comprised of nitric oxide and, in a presently preferred form, of anhydrous hydrochloric acid as well.</p>
申请公布号 CA1093217(A) 申请公布日期 1981.01.06
申请号 CA19780302453 申请日期 1978.05.02
申请人 EASTMAN KODAK COMPANY 发明人 GLUCK, RONALD M.
分类号 H01L21/302;H01L21/306;H01L21/3065;(IPC1-7):01L21/30 主分类号 H01L21/302
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