发明名称 Bipolar transistor fabrication process with an ion implanted emitter
摘要 A very high current ion implanted emitter is formed in a diffused base. Windows are made through the silicon nitride and silicon dioxide layes to both the base contact and the emitter regions using a resist mask. These regions are then protected by resist and the collector contact window is opened through the remainder of the silicon dioxide layer to the reach through region. A screen oxide is then grown in all the exposed areas after the removal of the resist mask. A resist mask is applied which covers only the base and Schottky anode regions. Arsenic is then implanted through the exposed screened areas followed by an etch back step to remove the top damaged layer. With some remaining screen oxide serving as a cap, the emitter drive-in is done.
申请公布号 US4243435(A) 申请公布日期 1981.01.06
申请号 US19790051078 申请日期 1979.06.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BARILE, CONRAD A.;GOTH, GOERGE R.;MAKRIS, JAMES S.;NAGARAJAN, ARUNACHALA;RAHEJA, RAJ K.
分类号 H01L29/73;H01L21/033;H01L21/265;H01L21/331;H01L21/76;H01L21/8222;H01L27/06;H01L27/07;H01L29/417;(IPC1-7):H01L21/22;H01L21/26 主分类号 H01L29/73
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