| 摘要 |
PURPOSE:To eliminate the influence due to overlapped field in the proximity of border between magnetic and electric fields, by departing the electric field from the magnetic field without sacrifice of the convergency of uniform electric field. CONSTITUTION:An ion beam I is converged through a lens 2 and injected vertically through point O on end face alpha of magnetic field B. In the magnetic field B the ion is rotated with radius corresponding to the number of mass and dispersed, then it is forcused and projected in parallel from end face beta. Then it enters into an electric field E crossing perpendicularly with the beam. Thereafter the ions I1-I3 separated in accordance with the number of mass and projected in parallel from end face beta move parabolically under uniform electric field E to be converged on end face S. Said converged ion beam is caught and detected by a collector C through a collector slit CS arranged on the end face S. When sweeping the strength of the electric field E properly, mass specter can be obtained on the collector C. |
