发明名称 SCHATTENWURFMASKE ZUM STRUKTURIEREN VON OBERFLAECHENBEREICHEN UND VERFAHREN ZU IHRER HERSTELLUNG
摘要 <p>A mask for structuring surface areas and a method for manufacture thereof. The mask includes at least one metal layer with throughgoing apertures which define the mask pattern and a semiconductor substrate for carrying the metal layer. The semiconductor substrate has throughholes that correspond to the mask pattern. The throughholes in the semiconductor substrate extend from the metal layer-covered surface on the front to at least one tub-shaped recess which extends from the other back surface into the semiconductor substrate. Holes are provided in a surface layer in the semiconductor substrate. The surface layer differs in its doping from the rest of the substrate and the holes which are provided in the surface layer have lateral dimensions larger than the apertures in the metal layer so that the metal layer protrudes over the surface layer.</p>
申请公布号 DE2922416(A1) 申请公布日期 1980.12.11
申请号 DE19792922416 申请日期 1979.06.01
申请人 IBM DEUTSCHLAND GMBH 发明人 BOHLEN,HARALD,DIPL.-PHYS.;ENGELKE,HELMUT,DIPL.-PHYS.DR.;GRESCHNER,JOHANN,DIPL.-PHYS.DR.;NEHMIZ,PETER,DIPL.-PHYS.DR.
分类号 H01L21/027;G03F1/20;(IPC1-7):H01L21/31;H01L21/308 主分类号 H01L21/027
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