| 摘要 |
PURPOSE:To perform the fault diagnosis and fault isolation of a tested logic circuit device in a short time by reducing the number of factors to be analyzed by performing the artificial operation of a peripheral equipment in a testing device. CONSTITUTION:On the basis of an operation command from logic unit 2 to be tested, test operation is carried out and its operation result is supplied to tested logic unit 2 for artificial operation. In addition to the above-mentioned aritificail operation, two kinds of operation, the supply of a test operation command and test information to tested logic unit 2 and a comparison between the test result from unit 2 and a perviously-stored expected value are realized by logic-unit testing device 4. |
