发明名称 Connector contact terminal contamination probe
摘要 Apparatus for testing connectors to detect the presence of contamination films and foreign material on the contact terminals of a connector. The testing apparatus comprises electrode apparatus (2) for use in engaging the contact terminals (701) of a connector (700) and support apparatus (3) intended to receive a connector and hold the connector in a fixed relationship to the electrode apparatus. The testing apparatus further comprises guide apparatus (4) for supporting electrodes (221) of the electrode apparatus and positioning apparatus (5) for enabling the guide apparatus to align the electrodes with the connector contact terminals and for enabling the electrode apparatus to engage the aligned electrodes with the connector contact terminal. Coupling apparatus (6) comprises a controller (60) arranged to selectively couple the engaged electrodes with electrical resistance measuring circuitry (100) to measure the resistance of a contamination film and foreign material appearing on the connector contact terminals.
申请公布号 US4232262(A) 申请公布日期 1980.11.04
申请号 US19780950724 申请日期 1978.10.12
申请人 EMO, GEORGE C.;GRAU, THOMAS G. 发明人 EMO, GEORGE C.;GRAU, THOMAS G.
分类号 G01R31/04;(IPC1-7):G01R31/04;G01R27/02;G01R1/06 主分类号 G01R31/04
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