发明名称 |
Apparatus for determining the thickness, moisture content or other parameter of a film or coating. |
摘要 |
<p>The apparatus employs two or more beams of radiation of different spectral composition which are transmitted through a sample (3) and received by a detector (8) which provides signals for computing the required parameter by ration measurements. The beams are directed to a sample zone where a part is transmitted through, and a part is reflected by a sample (3). The invention provides diffusing means (7) to receive the transmitted and reflected parts and pass the same onto a radiation responsive detector (8). The diffusing means (7) may be a ground glass plate or a member made of fused alumina. A concave mirror (9) may be used to reflect the reflected part back through the sample zone which is close to or at the centre of curvature of the mirror: A beamsplitter (12) may also be used so that the beams are directed substantially normal to a plane in the sample zone.</p> |
申请公布号 |
EP0017461(A1) |
申请公布日期 |
1980.10.15 |
申请号 |
EP19800301006 |
申请日期 |
1980.03.31 |
申请人 |
INFRARED ENGINEERING LIMITED |
发明人 |
EDGAR, ROGER FOERS |
分类号 |
G01B11/06;G01N21/31;(IPC1-7):01B11/06;01N21/17 |
主分类号 |
G01B11/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|