发明名称 Apparatus for determining the thickness, moisture content or other parameter of a film or coating.
摘要 <p>The apparatus employs two or more beams of radiation of different spectral composition which are transmitted through a sample (3) and received by a detector (8) which provides signals for computing the required parameter by ration measurements. The beams are directed to a sample zone where a part is transmitted through, and a part is reflected by a sample (3). The invention provides diffusing means (7) to receive the transmitted and reflected parts and pass the same onto a radiation responsive detector (8). The diffusing means (7) may be a ground glass plate or a member made of fused alumina. A concave mirror (9) may be used to reflect the reflected part back through the sample zone which is close to or at the centre of curvature of the mirror: A beamsplitter (12) may also be used so that the beams are directed substantially normal to a plane in the sample zone.</p>
申请公布号 EP0017461(A1) 申请公布日期 1980.10.15
申请号 EP19800301006 申请日期 1980.03.31
申请人 INFRARED ENGINEERING LIMITED 发明人 EDGAR, ROGER FOERS
分类号 G01B11/06;G01N21/31;(IPC1-7):01B11/06;01N21/17 主分类号 G01B11/06
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