发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To improve the characteristics of a semiconductor device with equal characteristics by diffusing impurity having the first conduction type on a semiconductor substrate, etching the surface of the diffused region with alkaline solution and diffusing impurity having the second conduction type in the above diffused region thus treated. CONSTITUTION:An impurity having the first conduction type (p-type) is diffused in a semiconductor substrate. The surface of the diffused region (a base region) 3 thus formed is then etched with alkaline solution. This treatment can remove unstable region of impurity density and crystal lattice defective layer 7 on the surface of the base region 3. Thereafter, A CVD film having an n-type impurity is adhered in the same manner as the conventional manner, it is thermally diffused to form an emitter region on the surface of the base region 3. |
申请公布号 |
JPS55130164(A) |
申请公布日期 |
1980.10.08 |
申请号 |
JP19790037502 |
申请日期 |
1979.03.29 |
申请人 |
TOKYO SHIBAURA ELECTRIC CO |
发明人 |
OZAWA SHIGERU;KITA TOSHINOBU |
分类号 |
H01L29/73;H01L21/331;H01L21/822;H01L27/04;H01L29/72 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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