发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the characteristics of a semiconductor device with equal characteristics by diffusing impurity having the first conduction type on a semiconductor substrate, etching the surface of the diffused region with alkaline solution and diffusing impurity having the second conduction type in the above diffused region thus treated. CONSTITUTION:An impurity having the first conduction type (p-type) is diffused in a semiconductor substrate. The surface of the diffused region (a base region) 3 thus formed is then etched with alkaline solution. This treatment can remove unstable region of impurity density and crystal lattice defective layer 7 on the surface of the base region 3. Thereafter, A CVD film having an n-type impurity is adhered in the same manner as the conventional manner, it is thermally diffused to form an emitter region on the surface of the base region 3.
申请公布号 JPS55130164(A) 申请公布日期 1980.10.08
申请号 JP19790037502 申请日期 1979.03.29
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 OZAWA SHIGERU;KITA TOSHINOBU
分类号 H01L29/73;H01L21/331;H01L21/822;H01L27/04;H01L29/72 主分类号 H01L29/73
代理机构 代理人
主权项
地址