发明名称 |
Four-quadrant, multiprobe-edge sensor for semiconductor wafer probing |
摘要 |
A four-quadrant multiprobe edge sensor system which comprises a printed circuit board having a plurality of data probes mounted thereon which include four data-detector probes particularly-positioned. The data-detector probes include a support body, and an arm supported by the body and attached thereto in an angular fashion. A probe tip in the form of a needle extends from and is attached to the arm. The probe tip includes a downwardly positioned point for contact with the surface having integrated circuits defined thereon. A force sensitive material is attached to but electrically isolated from the arm and has conductor leads extending therefrom with said force sensitive material comprising a piezoelectric material, for example. The four data-detector probes are located on the printed circuit board such that when being used for testing, the probe tips of the four data-detector probes are placed in each of the four corners of an integrated circuit chip defined on a semiconductor slice. The four-quadrant edge sensor detects the edge of the semiconductor slice regardless of the direction the slice is moving in relation to the probe head. This detection is signaled to a detection circuit which sends a signal to the multiprobe to begin indexing and reversing direction of the slice movement for testing the next chip.
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申请公布号 |
US4219771(A) |
申请公布日期 |
1980.08.26 |
申请号 |
US19780879038 |
申请日期 |
1978.02.21 |
申请人 |
TEXAS INSTRUMENTS INC |
发明人 |
RATLIFF, CHARLES R;REID, LEE R |
分类号 |
G01R31/26;G01R1/067;G01R1/073;G01R31/28;H01L21/66;(IPC1-7):G01R31/02;G01R31/22 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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