发明名称 MEASURING METHOD FOR THIN PLATE BY XXRAYS
摘要 PURPOSE:To determine easily and accurately the surface density of a material such as atoms and pigment by measuring photographic density through an X-ray film, by irradiating a thin plate, original paper applied with pigment, etc., including metal atoms, with X-rays produced by two fixed selected bulb voltages. CONSTITUTION:On original paper 5a such as paper and a plastic film, pigment 5b such as calcium carbonate is applied, charged or laminated to form thin plate 5. This thin plate 5 is irradiated with X-rays by selecting X-ray bulb voltage greater and less than the maximum value of mass absorption coefficient mub of calcium carbonate, thereby measuring through X-ray film 5 the photographic density by transmitted X-rays. Next, the condition, mua1mub2-mub1mua2 0, is satisfied on the basis of equation I to determine accurately surface density values Wa and Wb of the original paper and calcium carbonate. Further, when the photographic density is measured by irradiating atoms and pigment independently with X-rays by bulb voltages nearly equal in absorption coeffcient, the surface density of the thin plate of them is determined. Here, I1, I01, I2 and I02 represent actually-measured absorbance.
申请公布号 JPS55109928(A) 申请公布日期 1980.08.23
申请号 JP19790016090 申请日期 1979.02.16
申请人 VICTOR COMPANY OF JAPAN;SHIZUOKA PREFECTURE 发明人 OONUKI KATSUHIRO;NAKADA KOUJIROU
分类号 G01N23/04;G01G11/00;G01G17/00;G01G17/02;G01N23/02 主分类号 G01N23/04
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