发明名称 |
Semiconductor wafer thermal gradient zone melting processing - using a wafer with a bevelled edge to minimise thermal gradient edge distortions |
摘要 |
<p>In processing a semiconductor wafer by thermal gradient zone melting (TGZM) to form doped regions of recrystallised material in the wafer, a wafer is used whose outer edge is bevelled at predetermined included angle (alpha) with the bottom surface of the wafer. Pref. alpha = 41 degrees plus-or-minus 3 degrees. The bevelled edge minimises thermal gradient edge distortions without the need for additional processing steps or heat shields or guard rings, etc.</p> |
申请公布号 |
DE2948322(A1) |
申请公布日期 |
1980.06.19 |
申请号 |
DE19792948322 |
申请日期 |
1979.11.30 |
申请人 |
GENERAL ELECTRIC CO. |
发明人 |
RICHARD ANTHONY,THOMAS;ELLIS CLINE,HARVEY;KAST HARTMAN,DAVID;FUSHING CHANG,MIKE |
分类号 |
C30B13/02;H01L21/24;(IPC1-7):B01J17/12 |
主分类号 |
C30B13/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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