发明名称 Semiconductor wafer thermal gradient zone melting processing - using a wafer with a bevelled edge to minimise thermal gradient edge distortions
摘要 <p>In processing a semiconductor wafer by thermal gradient zone melting (TGZM) to form doped regions of recrystallised material in the wafer, a wafer is used whose outer edge is bevelled at predetermined included angle (alpha) with the bottom surface of the wafer. Pref. alpha = 41 degrees plus-or-minus 3 degrees. The bevelled edge minimises thermal gradient edge distortions without the need for additional processing steps or heat shields or guard rings, etc.</p>
申请公布号 DE2948322(A1) 申请公布日期 1980.06.19
申请号 DE19792948322 申请日期 1979.11.30
申请人 GENERAL ELECTRIC CO. 发明人 RICHARD ANTHONY,THOMAS;ELLIS CLINE,HARVEY;KAST HARTMAN,DAVID;FUSHING CHANG,MIKE
分类号 C30B13/02;H01L21/24;(IPC1-7):B01J17/12 主分类号 C30B13/02
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