| 摘要 |
PURPOSE:To enable to measure the bit error rate by using the memory in low access time even with the tested object in high speed clock frequency, by comparing the output pattern from the tested unit with the expected value pattern, through slow down speed than actual speed in the sampling system. CONSTITUTION:The virtual random noise pulse 1 is produced in synchronizing with the clock 6, and the clock 6 is frequency divided and fed to the sample section 3 and the memory section 4. The pulse 1 is fed to the tested object 2 and the output is sampled 3. The pulse train sampled at the sample section 3 and slow down and the output pulse train of the memory section stored in the expected value pattern are compared at the error count section 5, where the bit error rate can be measured. At the control section 8, the pulse generating section 1, tested object 2, memory section 4, and error count section 5 are set to a given initial state. |
