| 摘要 |
Disclosed is a transistor-transistor-logic (TTL) circuit which is testable by D. C. Testing Techniques. The improvement includes a high impedance network for providing sufficient base drive to drive the output transistor into conduction when the malfunctioning input transistor fails to provide a turn-off logic level. The high impedance network can be a Schottky barrier diode and an epitaxial resistor connected in a series path between a potential supply and the base region of the output transistor. |
