INTEGRATED CIRCUIT TESTING ARRANGEMENT,申请号SU19782658373-传众专利搜索

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发明名称	INTEGRATED CIRCUIT TESTING ARRANGEMENT
摘要
申请公布号	SU718814(A1)	申请公布日期	1980.02.29
申请号	SU19782658373	申请日期	1978.08.18
申请人	RYABUS YURIJ S,SU	发明人	RYABUS YURIJ S,SU
分类号	G01R31/303;G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/303
代理机构		代理人
主权项
地址

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