Method and instrumentation for the measurement of parameters of system devices

摘要

Method and instrumentation for the measurement and display of parameters of devices within operating systems where a multiplicity of parameters determine the characteristics of a device. Devices are excited by test signals independent of operating system signals and the responses to the test signals are detected and compared with stored device characteristics. The measurements are processed by searching for the best fit between the response of each device and the corresponding stored characteristics resulting in a set of parameter values that determines the state of the device. In cases where the response of a device depends largely on a single parameter processing simplifies to transformations of the measured responses and comparisons to stored calibration curves. Instrumentation is also disclosed that is particularly adapted for the measurement of the state of charge of batteries.