发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:For eliminating stage at opening section, to make melt-flow in the atmosphere of impurities and to etch the whole surfaces at least of said opening section and peripheral section of said opening section. CONSTITUTION:The low melting point glass insulating film 27 containing conductor-forming impurities is formed on a semiconductor substrate 25 and a contact opening is provided. Next, said substrate 25 is heat-treated in the oxidative atmosphere containing the same kind of impurities as that contained in said insulating film 27 for melt flow. Thereafter, a thin part over the whole range of said insulating film 29 formed at said contact opening is removed.</p>
申请公布号 JPS5521192(A) 申请公布日期 1980.02.15
申请号 JP19780095318 申请日期 1978.08.03
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OGAWA KAZUFUMI;YONEDA TADANAKA;CHIKAMURA TAKAO;FUJIWARA SHINJI;FUKAI SHIYOUICHI
分类号 H01L21/768;H01L21/28;H01L31/18 主分类号 H01L21/768
代理机构 代理人
主权项
地址