发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE:For eliminating stage at opening section, to make melt-flow in the atmosphere of impurities and to etch the whole surfaces at least of said opening section and peripheral section of said opening section. CONSTITUTION:The low melting point glass insulating film 27 containing conductor-forming impurities is formed on a semiconductor substrate 25 and a contact opening is provided. Next, said substrate 25 is heat-treated in the oxidative atmosphere containing the same kind of impurities as that contained in said insulating film 27 for melt flow. Thereafter, a thin part over the whole range of said insulating film 29 formed at said contact opening is removed.</p> |
申请公布号 |
JPS5521192(A) |
申请公布日期 |
1980.02.15 |
申请号 |
JP19780095318 |
申请日期 |
1978.08.03 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OGAWA KAZUFUMI;YONEDA TADANAKA;CHIKAMURA TAKAO;FUJIWARA SHINJI;FUKAI SHIYOUICHI |
分类号 |
H01L21/768;H01L21/28;H01L31/18 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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