| 摘要 |
<p>Errors in beam alignment measurement due to secondary emission are absent in a system which detects the position of the beam without interfering with it. Swept beams (F) passing between groups of pairs of plates (A1, B1, A2, B2) symmetrically disposed about the beam axis (XX) induce electrical signals whose strength and timing determine amplitude and beam centre. Electronic treatment consists of voltage amplication (1, 2, 3, 4), integration (I1, I2, I3, I4) and summing (S2, S3), a differencing (D2, D3) of individual plate signals. Beam alignment is indicated by fixed values of sums (s2, s3) and differences (d2, d3) which are compared for corresponding pairs of plates. For high frequency pulsed beams resonant cavities of various desings replace the plates and signals can be extracted with waveguides. Sweep frequencies can be linked to particle momentum by the timing measurements.</p> |
