| 摘要 |
PURPOSE:To reduce the diagnostic time of a doubled information processing circuit greatly, by diagnosing a 2nd information processing circuit successively after a 1st information processing circuit by micro instructions. CONSTITUTION:Doubled information processing circuits 30 and 31 perform the same operation at the same timing and the execution results are compared by comparator circuit 40 in sequential diagnostic unit 4, so that when coincidence is detected, a diagnostic program for one test process will be read out from memory unit 5 and then written to a corresponding area of control memory unit 2. Next, diagnostic indicator control circuit 41 diagnoses circuit 30 and circuit 31 in succession by using this written microprogram, and diagnostic results are edited and written to an assigned are of the main memory unit. Next, after diagnoses for single test processes of circuits 30 and 31 end, a next diagnostic microprogram is newly written to unit 2 by the indication of circuit 41 and the diagnostic process as mentioned above is continued. |
