Medium and HV semiconductor switch synthetic testing - using LV switching and HV blocking circuits and loss compensating recharger

摘要

The artificial test circuit is for medium and high voltage semiconductor switches and enables periodic testing using a low voltage switch current circuit and a high voltage switch blocking voltage circuit. This enables testing to be conducted on blocking characteristics with a fraction of the cost of equipment and power consumption of conventional circuits. A high voltage oscillator circuit loss compensating recharging circuit consists of a series circuit contg. a recharging transformer secondary, a choke, an alternating path thyristor pair, and a capacitor. The high voltage oscillator is connected in series with the capacitor.