Electrooptic apparatus for the measurement of ultrashort electrical signals.

摘要

An electrooptic measuring apparatus having both high voltage sensitivity and femtosecond time resolution comprises coplanar transmission lines fabricated on a semi-insulating multiple quantum well structure. An electrical signal, such as from a high speed electronic device, injected onto the transmission lines creates an electrical field parallel to the layer planes of the multiple quantum well structure. Excitonic electroabsorption by the multiple quantum well structure, in response to the parallel field, changes the transmissivity of the multiple quantum well structure. An external light beam directed through the multiple quantum well structure is modulated by the changes in transmissivity. By detecting this modulation, a sampling of the electrical signal is achieved.