| 摘要 |
This application describes a rotation-only CT scanner with beam deflections; the deflection and the rotation being so related as to permit the derivation of absorption data in groups focussed on respective "pivot points" outside the detector locus. Data derived from different detectors, but focussed on the same pivot point, relate to groups of paths, some of which overlap, and the overlap is used to compare the performances of different detectors. To reduce data handling, data provided by adjacent detectors can be combined.
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