| 摘要 |
The anisotropic value rm of cold rolled, recrystallization annealed thin and very thin metal sheet 2 is determined by employing X-rays 1 for the measurement of the crystallographic texture. The sheets are irradiated with incident primary radiation at an energy of at least 20 keV, the rays diffracted at the crystal lattices are detected 3, and the detected X-ray quanta are converted into voltage pulses proportional to their energy. The voltage pulses are then discriminated in respect of pulse height and the maxima and the frequency distribution of the pulse heights are arranged in accordance with predetermined diffraction reflexes, so that the intensity of the diffraction reflex is measured at fixed values of the latitude angle alpha and the azimuth angle beta . <IMAGE> |
