X-ray diffraction system,申请号US19550500051-传众专利搜索

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法人/股东/高管

发明名称	X-ray diffraction system
摘要
申请公布号	US2870337(A)	申请公布日期	1959.01.20
申请号	US19550500051	申请日期	1955.04.08
申请人	SIEMENS-REINIGER-WERKE AKTIENGESELLSCHAFT	发明人	NEFF HANS
分类号	G01N23/207	主分类号	G01N23/207
代理机构		代理人
主权项
地址

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