发明名称 GERAET UND VERFAHREN FUER DIE ROENTGENLITHOGRAPHIE
摘要 <p>In order to obtain shorter exposure time and to obtain a longer life in x-ray lithography apparatus, an x-ray target made of tungsten is utilized and the apparatus operated to generate the tungsten M-line, this line being at a wavelength which will be absorbed by the resist normally used in lithography. To develop the resist, which was initially designed for use in an electron beam lithography, a developing method is used in which a initial short development with a high concentration is first carried out followed by a longer, full development with a concentration which is approximately the lowest at which complete development will take place.</p>
申请公布号 DE2854693(A1) 申请公布日期 1979.07.19
申请号 DE19782854693 申请日期 1978.12.18
申请人 THE PERKIN-ELMER CORP. 发明人 DEREK BUCKLEY,WILLIAM
分类号 G03B42/02;G03C5/08;G03F7/20;H01J35/02;H01L21/027;H01L21/30;H05G1/00;(IPC1-7):01J35/00;01L21/30 主分类号 G03B42/02
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