发明名称 |
METHOD AND CIRCUIT FOR DETERMINING VOLTAGE AND CURRENT VALUES CIATED WITH GIVEN SWITCH-ON DURATIONS OF AN X-RAY SOURCE |
摘要 |
<p>Determination of the voltage and current values for an X-ray source by choosing a point of intersection with the lowest voltage value of an operating range limitation function of the X-ray source with a current-voltage function passed through the current-voltage coordinates of a desired current value determined by an exposure measurement.</p> |
申请公布号 |
CA1055163(A) |
申请公布日期 |
1979.05.22 |
申请号 |
CA19740211098 |
申请日期 |
1974.10.09 |
申请人 |
N.V. PHILIPS'GLOEILAMPENFABRIEKEN |
发明人 |
SMITS, WIGLE F.;SPAAK, WILLEM E. |
分类号 |
H05G1/30;H05G1/46;(IPC1-7):05G1/32 |
主分类号 |
H05G1/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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