发明名称 |
HALBLEITERBAUELEMENT MIT EINER MOS-KAPAZITAET |
摘要 |
<p>The semiconductor element forms an integrated circuit and consists of a substrate with on opposite conductivity semiconductor layer, coated with an insulating film. On the latter is provided a second conductive layer, between which and a highly doped second conductivity zone, which bounds the surface of the first semiconductor layer(2), is formed a MOS capacitance. Underneath the highly doped zone (3) in the first semiconductor layer is provided a surrounding zone (10) of the conductivity, which is pref. provided with a terminal electrode (4). A further terminal electrode (12) may be arranged on the first semiconductor layer. This arrangement reduces parasitic capacitance between the MOS capacitance and the semiconductor substrate, without any further measures.</p> |
申请公布号 |
DE2735529(A1) |
申请公布日期 |
1979.02.15 |
申请号 |
DE19772735529 |
申请日期 |
1977.08.06 |
申请人 |
PHILIPS PATENTVERWALTUNG GMBH |
发明人 |
GOERTH,JOACHIM,DIPL.-ING. |
分类号 |
H01L21/761;H01L27/08;H01L29/94;H03B5/36;H03J3/18;(IPC1-7):01L29/94 |
主分类号 |
H01L21/761 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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