发明名称 HALBLEITERBAUELEMENT MIT EINER MOS-KAPAZITAET
摘要 <p>The semiconductor element forms an integrated circuit and consists of a substrate with on opposite conductivity semiconductor layer, coated with an insulating film. On the latter is provided a second conductive layer, between which and a highly doped second conductivity zone, which bounds the surface of the first semiconductor layer(2), is formed a MOS capacitance. Underneath the highly doped zone (3) in the first semiconductor layer is provided a surrounding zone (10) of the conductivity, which is pref. provided with a terminal electrode (4). A further terminal electrode (12) may be arranged on the first semiconductor layer. This arrangement reduces parasitic capacitance between the MOS capacitance and the semiconductor substrate, without any further measures.</p>
申请公布号 DE2735529(A1) 申请公布日期 1979.02.15
申请号 DE19772735529 申请日期 1977.08.06
申请人 PHILIPS PATENTVERWALTUNG GMBH 发明人 GOERTH,JOACHIM,DIPL.-ING.
分类号 H01L21/761;H01L27/08;H01L29/94;H03B5/36;H03J3/18;(IPC1-7):01L29/94 主分类号 H01L21/761
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