Programmable probe fixture and method of connecting units under test with test equipment

摘要

A support houses a plurality of probes for guided movement relative to a printed circuit board unit under test fixedly mounted adjacent the support. Each probe is operatively associated with independent, pneumatically operated, piston and cylinder drive means for moving individual probes selected according to a predetermined program from a first retracted position to a second extended position. In the extended position only a continuous conductive path through the piston and cylinder is formed between the unit under test and an electrical interface for transmitting electronic signals therebetween. Several varieties of probes are provided for low and high frequency applications.