发明名称 Fault locator for circuit assemblies - produces individual part circuits and stores and compares data related to discrepancies
摘要 <p>The assemblies are tested by a program controlled testing device. It has a coupler connected by a first line plane to a distributor in the assembly, and by the other line plane to test and measurement units. Each point of the distributor is individually connected through the coupler to each measurement unit, so that in each test step closed circuits are produced in the assembly, which mostly represent parts of extensive function circuits. When a deviation from a programmed values appears, the numbers and marks of all points in circuits produced in the corresponding step are stored. The store is connected to a comparator which, starting from the stored connecting points marks in an initial test step with smaller number of point markings, consecutively tests the stored marks of all test steps for coincidence of at least two with those of the initial step. Then a new initial step is derived from the steps with fewer coincidences, and thus two test steps with at least two identical point marks are determined.</p>
申请公布号 DE2729950(A1) 申请公布日期 1979.01.18
申请号 DE19772729950 申请日期 1977.06.30
申请人 SIEMENS AG 发明人 SCHIRGE,PETER;RUEHRMUND,WOLFGANG,ING.
分类号 G01R31/28;(IPC1-7):G01R31/28;H04Q1/22 主分类号 G01R31/28
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