发明名称 Method of making silicon on sapphire field effect transistors with specifically aligned gates
摘要 The method comprises forming a blind hole in a sapphire substrate using a sulfur hexafluoride gas etchant and an etch mask comprising a single layer of silicon nitride. The blind holes are filled with epitaxially grown silicon and field effect transistors are laid out with their gates orthogonal to a line which is at a 45 DEG angle to a standard wafer flat, i.e. orthogonal to the projection of the "c" axis onto the "r" plane of the sapphire wafer.
申请公布号 US4131496(A) 申请公布日期 1978.12.26
申请号 US19770860855 申请日期 1977.12.15
申请人 RCA CORP. 发明人 WEITZEL, CHARLES E.;CAPEWELL, DAVID R.
分类号 H01L21/205;H01L21/311;H01L21/86;H01L29/04;(IPC1-7):H01L21/86;H01L27/12 主分类号 H01L21/205
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