发明名称 Process of forming a semiconductor device
摘要 A film is formed over a substrate using a physical vapor deposition method. When using ionized metal plasma physical vapor deposition, the deposition chamber configuration or operating parameters are adjusted to achieve the desired film characteristics. If the film is to be substantially uniform in thickness across a substrate, the deposition species density is made higher at locations away from the center of the substrate.
申请公布号 US6165567(A) 申请公布日期 2000.12.26
申请号 US19990290385 申请日期 1999.04.12
申请人 MOTOROLA, INC. 发明人 VENTZEK, PETER LOWELL GEORGE;CORONELL, DANIEL G.;HARTIG, MICHAEL J.;ARNOLD, JOHN C.
分类号 C23C14/04;C23C14/35;H01L21/768;(IPC1-7):C23C14/34;C23C14/48 主分类号 C23C14/04
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