发明名称 |
PLASMA PROCESS APPARATUS HAVING LIFT PIN WITH WEIGHT DETECTING FUNCTION |
摘要 |
PURPOSE: A plasma process apparatus having a lift pin with a weight detecting function is provided to recognize the weight value of a wafer and display an abnormal state when the recognized weight value is higher or lower than a reference value by installing a weight detecting unit capable of detecting the weight of a wafer in the upper portion of a plurality of lift pins. CONSTITUTION: A closed chamber has predetermined volume. A wafer stage on which the wafer is settled is installed in the lower portion of the chamber. A lift plate is installed in the lower portion of the wafer stage, capable of moving up/down. The plurality of lift pins(31) move up/down the substrate(23), connected to the lift plate. The weight detecting unit(33) detects the weight of the substrate, installed in the upper portion of the lift pin.
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申请公布号 |
KR20030037157(A) |
申请公布日期 |
2003.05.12 |
申请号 |
KR20010068265 |
申请日期 |
2001.11.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
EOM, SANG YONG |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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