发明名称 PLASMA PROCESS APPARATUS HAVING LIFT PIN WITH WEIGHT DETECTING FUNCTION
摘要 PURPOSE: A plasma process apparatus having a lift pin with a weight detecting function is provided to recognize the weight value of a wafer and display an abnormal state when the recognized weight value is higher or lower than a reference value by installing a weight detecting unit capable of detecting the weight of a wafer in the upper portion of a plurality of lift pins. CONSTITUTION: A closed chamber has predetermined volume. A wafer stage on which the wafer is settled is installed in the lower portion of the chamber. A lift plate is installed in the lower portion of the wafer stage, capable of moving up/down. The plurality of lift pins(31) move up/down the substrate(23), connected to the lift plate. The weight detecting unit(33) detects the weight of the substrate, installed in the upper portion of the lift pin.
申请公布号 KR20030037157(A) 申请公布日期 2003.05.12
申请号 KR20010068265 申请日期 2001.11.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 EOM, SANG YONG
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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