发明名称 |
Method of manufacturing a two-phase charge-transfer semiconductor device and a device obtained by said method |
摘要 |
A new method of manufacturing a two-phase charge-transfer device operating by the charge-coupled technique, in which the asymmetry means associated with each group of electrodes are constituted by impurity barriers implanted in the semiconductor substrate and are automatically positioned in relation to the electrodes, in particular by carrying out implantation operations through masks constituted by films of silicon nitride and by the electrodes themselves, the films of silicon nitride subsequently being completely removed.
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申请公布号 |
US4121333(A) |
申请公布日期 |
1978.10.24 |
申请号 |
US19770801751 |
申请日期 |
1977.05.31 |
申请人 |
THOMSON-CSF |
发明人 |
BERGER, JEAN LUC;BOURRAT, MICHEL;THENOZ, YVES;WOEHRN, DANIEL |
分类号 |
H01L21/339;H01L21/8234;H01L29/10;(IPC1-7):B01J17/00 |
主分类号 |
H01L21/339 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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