发明名称 |
Method and device for recognizing a specific pattern |
摘要 |
This method for recognizing a specific pattern is characterized in a process of extracting feature parts wherein one or more certain feature parts of specific shape are extracted from an input pattern; the next feature part is then extracted from an extracting area which is determined from the position on the input pattern where a previous feature part was extracted; and in case that the next feature part fails to be extracted from the extracting area so determined, the initial condition is restored thereby extracting the feature part by successively limiting extracting areas.
|
申请公布号 |
US4115761(A) |
申请公布日期 |
1978.09.19 |
申请号 |
US19770766486 |
申请日期 |
1977.02.07 |
申请人 |
HITACHI, LTD. |
发明人 |
UEDA, HIROTADA;UNO, TAKESHI;EJIRI, MASAKAZU;IKEDA, SADAHIRO;MATSUOKA, SHINJI |
分类号 |
G06K9/46;(IPC1-7):G06K9/12 |
主分类号 |
G06K9/46 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|