发明名称 Inspection apparatus for automatically detecting the unevenness or the flaws of a coating
摘要 A scanning inspection apparatus comprising two light beams each having a different angle of incidence to the surface of the object and light detecting means for receiving lights reflected by the surface of the object. Said two light beams are provided by a light beam generating means, a rotating mirror and a semitransparent mirror.
申请公布号 US4110047(A) 申请公布日期 1978.08.29
申请号 US19760667966 申请日期 1976.03.17
申请人 KONISHIROKU PHOTO INDUSTRY CO., LTD. 发明人 TAKAHASHI, TOKUJI
分类号 G01B11/30;G01N21/89;G01N21/892;G02B26/12;(IPC1-7):G01N21/32 主分类号 G01B11/30
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