发明名称 |
PATTERN DETECTION |
摘要 |
PURPOSE:To make it possible to find out the defect without any dictionary by judging the inflection point of the center bit cell comes from the defect when a bit indicating the inflection point appears in the center bit cell of a matrix bit cell a0d when the bit indirating the inflection point appears in the bit cell other than the center. |
申请公布号 |
JPS5383768(A) |
申请公布日期 |
1978.07.24 |
申请号 |
JP19760159472 |
申请日期 |
1976.12.29 |
申请人 |
FUJITSU LTD |
发明人 |
GOTOU YOSHIAKI;NAKASHIMA MASAHITO;ANDOU SANETOSHI |
分类号 |
G01B15/00;G01B15/04;G01B21/20;G01N21/88;G01N21/956;G06T1/00;G06T7/60 |
主分类号 |
G01B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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