| 发明名称 |
TESTING EQUIPMENT FOR LOGICAL CIRCUIT |
| 摘要 |
PURPOSE:To make it possible to test the logical circuit composed of a dynamic circuit by generating a refresh pattern for holding a measured body in an operation state in the time between test pattern generation and the next pattern generation. |
| 申请公布号 |
JPS5376641(A) |
申请公布日期 |
1978.07.07 |
| 申请号 |
JP19760152403 |
申请日期 |
1976.12.17 |
| 申请人 |
NIPPON ELECTRIC CO |
发明人 |
MATSUKAWA YASUSHI |
| 分类号 |
G06F11/22;G01R31/28;G06F11/00 |
主分类号 |
G06F11/22 |
| 代理机构 |
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代理人 |
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