HIGH FREQUENCY BIAS CURRENT DRIVING CIRCUIT,申请号JP19760143092-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	HIGH FREQUENCY BIAS CURRENT DRIVING CIRCUIT
摘要
申请公布号	JPS5367414(A)	申请公布日期	1978.06.15
申请号	JP19760143092	申请日期	1976.11.29
申请人	NIPPON ELECTRIC CO	发明人	OOHASHI TAKEHIRO
分类号	G11B5/03	主分类号	G11B5/03
代理机构		代理人
主权项
地址

您可能感兴趣的专利

LIQUID CRYSTAL DISPLAY DEVICE

COMPRESSED AIR GENERATOR FOR LIQUID CRYSTAL MAKING DEVICE

SPACER SCATTERING METHOD AND DEVICE

VIBRATION-PROOF OPTICAL DEVICE AND CROSS SPRING MECHANISM

PROJECTOR DEVICE AND COLOR SYNTHESIZING DEVICE

OPTICAL SYSTEM AND ADJUSTING METHOD FOR OPTICAL ELEMENT

OPTICAL FIBER CABLE

MOUNTING STRUCTURE FOR HINGE PIECE AND FRAME MEMBER, SPECTACLES HAVING THIS MOUNTING STRUCTURE AND MOUNTING METHOD FOR HINGE PIECES AND FRAME MEMBRANE

DEVICE FOR DETECTING EXCITATION AND MAGNETIC RESONANCE

TEST DEVICE AND TEST METHOD OF SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE MEASURING SYSTEM, CONTROL METHOD OF SEMICONDUCTOR DEVICE MEASURING SYSTEM AND STORAGE MEDIUM

GOOD/DEFECT DETERMINING METHOD FOR CAPACITOR

PROBE PIN, PROBE CARD, TESTING DEVICE, AND MANUFACTURING METHOD FOR PROBE PIN

SPECIMEN ANALYTICAL SYSTEM

MELTING TEMPERATURE MEASURING APPARATUS USING SPECTROMETRY

SAMPLE HOLDER AND SAMPLE ANALYZER

METHOD AND DEVICE FOR INSPECTING INSIDE OF VITREOUS SILICA MATERIAL FOR DEFECT

INSPECTION DEVICE

METHOD AND APPARATUS FOR MEASURING NUMBER OF IN-LIQUID PARTICLE AS WELL AS EVALUATING METHOD FOR MEASURED NUMERICAL VALUE