发明名称 PLANARIZATION OF INTEGRATED CIRCUIT SURFACES THROUGH SELECTIVE PHOTORESIST MASKING
摘要 <p>An integrated circuit substrate surface, particularly a surface of electrically insulative material, having a pattern of elevated areas and a complementary pattern of unelevated areas is planarized by forming the photoresist pattern in registration with the pattern of unelevated areas, the photoresist pattern having narrower lateral dimensions than said elevated pattern whereby registration is facilitated, flowing the photoresist pattern to laterally expand the photoresist to cover and thereby mask the unelevated areas, and etching to lower the elevated areas which remain uncovered by the photoresist.</p>
申请公布号 CA1030666(A) 申请公布日期 1978.05.02
申请号 CA19750225976 申请日期 1975.04.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FENG, BAI-CWO
分类号 G03F1/08;C23F1/00;G03F1/00;G03F7/16;G03F7/26;H01L21/00;H01L21/027;H01L21/306;H01L21/3105;H01L21/32;H01L21/76;H01L21/762;H01L23/29;H05K3/46 主分类号 G03F1/08
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