| 摘要 |
A device for measuring the total reflectivity, i.e., specular plus scatter, of a small area of a material at various laser frequencies and intensities. The device includes appropriate transmitting and collecting optics in conjunction with a thermopile-type energy sensor with an external metering circuit. The metering circuit can be quickly adjusted to read total reflectivity of a sample placed in front of the reflectivity-measuring device.
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