METHOD OF MEASURING ELECTRICAL PARAMETERS OF SEMICONDUCTOR MATERIALS,申请号SU19762358864-传众专利搜索

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发明名称	METHOD OF MEASURING ELECTRICAL PARAMETERS OF SEMICONDUCTOR MATERIALS
摘要
申请公布号	SU591974(A1)	申请公布日期	1978.02.05
申请号	SU19762358864	申请日期	1976.05.17
申请人	FIZIKO-TEKHNICHESKIJ I IM A.F.IOFFE	发明人	KOROLKOV VLADIMIR ILICH,SU;YAKOVENKO ALEKSANDR ALEKSANDROVICH,SU;DANILCHENKO VALERIJ GRIGOREVICH,SU;BERGMANN YAAK VALDEKOVICH,SU
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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