发明名称 DELAY LOCKED LOOP
摘要 A delay locked loop is provided to reduce a current consumption by variously optimizing a current quantity necessary for an operation based on a combination signal of a delay start signal and a test mode setting signal. A delay locked loop includes a delay chain(200), a delay cell current amplifying unit(300), and a bias unit(10). The delay chain has a plurality of delay cells which are coupled in series, and receives a couple of external clock signals. The delay chain selects a predetermined number of delay cells to perform an output operation in response to a plurality of output sell selection signals. The delay chain outputs a couple of delayed clock signals and a couple of phase combination clock signals. The delay cell amplifying unit receives a couple of last delayed clock signals of the couple of delayed clock signals. If a duty ratio of a couple of last delayed clock signals is distorted in response to a combination of a test mode setting signal and a delay start signal of a bit of a plurality of delay operation start signals, the delay cell amplifying unit corrects and amplifies uniformly the duty ratio by adjusting a reference phase voltage. The bias unit supplies independently first and second bias currents necessary for an operation of the delay chain and the delay cell current amplifying unit.
申请公布号 KR20080067466(A) 申请公布日期 2008.07.21
申请号 KR20070004792 申请日期 2007.01.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO, JAE KI
分类号 H03L7/00 主分类号 H03L7/00
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