发明名称 Method and masking structure for configurating thin layers
摘要 A method for configurating thin layers, particularly in thin film circuits, wherein a layer to be configurated is irradiated with an electron beam passing through a mask to obtain a configuration corresponding to the configuration of selected portions of such a mask, and a mask for use therein, as well as a method of making such mask, in which the mask is so constructed that, in use, the electron beam completely radiates the geometric shadow areas of the supporting elements on the thin film.
申请公布号 US4061814(A) 申请公布日期 1977.12.06
申请号 US19750564105 申请日期 1975.04.01
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 POLITYCKI, ALFRED
分类号 H05K3/00;C23F4/00;G03F7/20;H01L49/02;(IPC1-7):B32B3/10 主分类号 H05K3/00
代理机构 代理人
主权项
地址