发明名称 |
TESTING OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE:Testing of service life within an extremely short time is made possible by radiating light which is readily absorbed in an active layer to a photo semiconductor device to put it in an excited state and heating this to accelerate the degradation of the active layer. |
申请公布号 |
JPS52146566(A) |
申请公布日期 |
1977.12.06 |
申请号 |
JP19760063725 |
申请日期 |
1976.05.31 |
申请人 |
FUJITSU LTD |
发明人 |
IMAI HAJIME;TAKUSAKAWA KIMITO |
分类号 |
H01L21/66;H01L33/14;H01L33/30 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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