发明名称 Overlap and overscan exposure control system
摘要 In an optical scanning exposure system for manufacturing cathode ray tubes having a faceplate with an inner surface layer of photosensitive material and an adjacent apertured mask wherein the exposure system includes a light source providing a light beam, an angle of incidence deflector means for deflecting the light beam at an angle related to the angle of incidence of an electron beam, means for imaging the light beam, and a means for scanning the light beam in a predetermined fashion over the apertured mask to expose the photosensitive material, a control system having a means for storing information representative of the angle of incidence of a light beam and the rate of scanning of a light beam between a matrix of positional locations on the faceplate, a scan rate means for controlling the rate of horizontal and vertical light beam scanning, an encoder means providing light beam positional information to the storage means, and an angle of incidence control means for activating the angle of incidence deflector means in accordance with angular information of the storage means.
申请公布号 US4053904(A) 申请公布日期 1977.10.11
申请号 US19760699054 申请日期 1976.06.23
申请人 GTE SYLVANIA INCORPORATED 发明人 WILLIAMS, G. NORMAN;FISHER, MAHLON B.
分类号 H01J9/227;(IPC1-7):G03B41/00 主分类号 H01J9/227
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