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经营范围
发明名称
ELECTRONIC MICROSCOPE AND EQUIVALENT UNIT
摘要
PURPOSE:To enable accurate micro analysis, by detecting the component removed from the test piece with the shock of electron ray and by making complementarily data comparison for the analysis of the residual component.
申请公布号
JPS52113152(A)
申请公布日期
1977.09.22
申请号
JP19760029118
申请日期
1976.03.19
申请人
HITACHI LTD
发明人
NAGATANI TAKASHI
分类号
G01N23/227;G01N23/225;H01J37/26
主分类号
G01N23/227
代理机构
代理人
主权项
地址
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