发明名称 Reticle calibrated diameter gauge
摘要 A non-contact optical gauging device in which a laser beam is deflected to produce a bidirectional scan. The beam is split; a measuring portion scans an object being inspected while the other portion scans a calibration reticle having alternating opaque and transparent bands. The alternating transmission and ocultation of the beam through the reticle is used to generate calibration pulses, each representing a predetermined increment of movement of the calibration beam. Ocultation of the measuring beam by the object being measured generates a signal which is used to control counting of the calibration pulses as an indication of the dimension being measured. Bidirectional averaging is employed to minimize errors due to object motion in the direction of beam scanning. Variations are disclosed in which two measuring beams and one or two calibration beams, are employed for measuring large objects or for dual axis measurement, the latter by orthogonal projection onto the object being measured.
申请公布号 US4043673(A) 申请公布日期 1977.08.23
申请号 US19750566413 申请日期 1975.04.09
申请人 AUTECH CORPORATION 发明人 HARRIS, DAVID E.;WATSON, ROBERT M.;REDMYER, JOHN D.
分类号 G01B11/02;G01B11/10;(IPC1-7):G01B11/10 主分类号 G01B11/02
代理机构 代理人
主权项
地址