发明名称 Radiological measuring arrangement
摘要 A radiological measuring arrangement having first and second X-ray measurement fields wherein both X-ray beam measurement fields or areas are located concentrically with respect to each other in one plane, and that for the generation of a signal corresponding to the formation of the surface dosage product there are present means for forming the sum of the output signals of the two beam measurement fields. In the inventive measuring arrangement in order to encompass two magnitudes, namely, the surface dosage product and the incidence dosage, only a single beam measurement element need be applied to the diaphragm housing of an X-ray tube. A time measuring device or chronometer may be provided at the output of the second measurement field. In this further construction it becomes possible, in addition to the surface dosage product on the incidence dosage, to also obtain the transillumination time for X-ray exposures.
申请公布号 US4027166(A) 申请公布日期 1977.05.31
申请号 US19750570161 申请日期 1975.04.21
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 AICHINGER, HORST;SLADEK, WALTER
分类号 A61B6/06;A61B6/08;H05G1/42;(IPC1-7):H05G1/30 主分类号 A61B6/06
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