发明名称 MASK STRUCTURE FOR X-RAY LITHOGRAPHY
摘要 <p>A mask structure for use in an x-ray lithographic system comprises as the substrate thereof a Mylar film stretched over and bonded to a support ring. The stretched Mylar film exhibits an attractive combination of advantageous properties such as high planarity, dimensional stability, mechanical strength, low x-ray absorption, resistance to organic solvents, optical transparency, and ready availability in a variety of thicknesses with optical quality surfaces.</p>
申请公布号 CA1010578(A) 申请公布日期 1977.05.17
申请号 CA19740213950 申请日期 1974.11.18
申请人 WESTERN ELECTRIC COMPANY, INCORPORATED 发明人 COQUIN, GERALD A.;MALDONADO, JUAN R.;MAYDAN, DAN
分类号 H01L21/027;G03F1/22;G03F1/48;H01L21/30 主分类号 H01L21/027
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