发明名称 Monitoring of resistor manufacture by anodic process - has resistor in test bridge network and electrolytic circuit with anti:synchronised switches
摘要 <p>The circuit tests resistors during layering. The resistor under test is connected as the anode in the deposition circuit and alternately measured against a standard value in the test circuit. The layers are formed by anodic oxidation. The test circuit consists of a bridge network with a standard resistance in one arm and the resistor being manufactured in the other, opposite a cathode (K) in an electrolyte. The DC supply to the bridge is via a switch (r1) which is synchronised to open when another switch closes. The other switch controls the electrolytic process.</p>
申请公布号 DE2548027(A1) 申请公布日期 1977.04.28
申请号 DE19752548027 申请日期 1975.10.27
申请人 SIEMENS AG 发明人 MUNT,HARTWIG,DIPL.-PHYS.
分类号 H01C17/26;(IPC1-7):01C17/22 主分类号 H01C17/26
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